Customer Background:
A domestic technology company specializes in the development of communication and information products. Its business spans transmission equipment, multimedia devices, system integration engineering, and terminal equipment, leveraging deep technical R&D and product integration capabilities.
Application Scenario:
Primarily used in high-low temperature cycle testing equipment for mobile phone chips, where chips are tested under extreme temperature conditions to identify and automatically screen out defective units.
Core Requirements:
The equipment must operate stably within a harsh temperature range of -40°C to 150°C, while adhering to strict spatial and weight constraints to ensure efficient and precise testing.
Project Challenges:
Extreme Temperature Environment: The wide working temperature range (-40°C to 150°C) imposes high demands on motor materials and performance.
Space and Weight Limitations: The compact equipment structure requires the motor to be lightweight while meeting torque output requirements.
Environmental Durability: The equipment operates long-term in high-temperature and high-humidity conditions, requiring the motor to possess rust resistance and long-term reliability.
Solution:
To address the customer's needs, we customized the HS5756 stepping motor-gear reducer integrated unit, implementing the following measures:
Integrated Design: The motor and gear reducer are highly integrated, saving installation space and simplifying the structure.
Lightweight Optimization: The motor is designed to reduce weight while ensuring torque output meets testing requirements, adapting to the equipment's weight constraints.
Material and Process Upgrades: Special rust-proof treatments are applied to key motor components, enhancing long-term operational reliability in high-temperature and high-humidity environments.
Results and Value:
The HS5756 High and Low Temperature stepping motor has been successfully applied in the customer's high-low temperature chip testing equipment. It ensures stable operation and precise control under extreme temperatures, enabling efficient chip testing and automatic screening of defective units. This has significantly improved testing efficiency and the overall reliability of the equipment.
102, Tianji Building, Xinggang Tongchuang Hui, No. 6099 Bao'an Avenue, Xinhe Community, Fuhai Street, Bao'an District, Shenzhen, China
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